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How to Develop a Production-Worthy Octal-Site Sub-Pico Farad Capacitance Solution

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How to Develop a Production-Worthy Octal-Site Sub-Pico Farad Capacitance Solution
How to Develop a Production-Worthy Octal-Site Sub-Pico Farad
Capacitance Solution
In this paper, the authors will describe how to develop an octal-site sub-pico farad capacitance solution. They
will describe hardware design (probe card) and software coding. For hardware design, tester resources
selection, routing guidelines, choice of probe head selection, relays and placement of components will be
discussed. For software, the authors will utilize an Eagle Test pattern base solution to synchronize tester
resources, apply stimulus in a single-site approach without compromising test time, utilize an on board DSP
function in resources to minimize data transfer time for calculating test results and demonstrate capacitance
and leakage.
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